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[IEEE 2010 35th IEEE Photovoltaic Specialists Conference (PVSC) - Honolulu, HI, USA (2010.06.20-2010.06.25)] 2010 35th IEEE Photovoltaic Specialists Conference - Degradation analysis of InGaP/GaAs/Ge triple-junction solar cells in high-temperature and high-light-intensity environments by luminescence techniques
Toyota, Hiroyuki, Iwai, Takaaki, Shimada, Takanobu, Imaizumi, Mitsuru, Tanaka, Koji, Tajima, MichioYear:
2010
Language:
english
DOI:
10.1109/pvsc.2010.5617197
File:
PDF, 714 KB
english, 2010