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[IEEE 2008 42nd Annual Conference on Information Sciences and Systems (CISS) - Princeton, NJ, USA (2008.03.19-2008.03.21)] 2008 42nd Annual Conference on Information Sciences and Systems - Fusing rate-specific SVM Classifiers for ±1 embedding steganalysis
Marvel, Lisa, Henz, Brian, Boncelet, CharlesYear:
2008
Language:
english
DOI:
10.1109/ciss.2008.4558552
File:
PDF, 349 KB
english, 2008