[IEEE 2008 IEEE International Conference on Automation and...

  • Main
  • [IEEE 2008 IEEE International...

[IEEE 2008 IEEE International Conference on Automation and Logistics (ICAL) - Qingdao, China (2008.09.1-2008.09.3)] 2008 IEEE International Conference on Automation and Logistics - Improved morphological method in the detection of log CT image with defect

Dawei Qi,, Chao Kong,, Lei Yu,
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2008
Language:
english
DOI:
10.1109/ical.2008.4636341
File:
PDF, 229 KB
english, 2008
Conversion to is in progress
Conversion to is failed