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[IEEE 2008 IEEE International Conference on Automation and Logistics (ICAL) - Qingdao, China (2008.09.1-2008.09.3)] 2008 IEEE International Conference on Automation and Logistics - Improved morphological method in the detection of log CT image with defect
Dawei Qi,, Chao Kong,, Lei Yu,Year:
2008
Language:
english
DOI:
10.1109/ical.2008.4636341
File:
PDF, 229 KB
english, 2008