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[IEEE 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012) - Dresden (2012.03.12-2012.03.16)] 2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) - A case study on the application of real phase-change RAM to main memory subsystem
Suknam Kwon,, Dongki Kim,, Youngsik Kim,, Sungjoo Yoo,, Sunggu Lee,Year:
2012
Language:
english
DOI:
10.1109/date.2012.6176474
File:
PDF, 132 KB
english, 2012