![](/img/cover-not-exists.png)
[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs
Mirkhani, Shahrzad, Abraham, Jacob A., Vo, Toai, Jun, Hongshin, Eklow, BillYear:
2012
Language:
english
DOI:
10.1109/test.2012.6401584
File:
PDF, 838 KB
english, 2012