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[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - FALCON: Rapid statistical fault coverage estimation for complex designs

Mirkhani, Shahrzad, Abraham, Jacob A., Vo, Toai, Jun, Hongshin, Eklow, Bill
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Year:
2012
Language:
english
DOI:
10.1109/test.2012.6401584
File:
PDF, 838 KB
english, 2012
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