[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Super-Resolution Texture Mapping from Multiple View Images
Iiyama, Masaaki, Kakusho, Koh, Minoh, MichihikoYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.449
File:
PDF, 2.30 MB
english, 2010