Fast Enhancement of Validation Test Sets for Improving the...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2009 / 05 Vol. 17; Iss. 5

Fast Enhancement of Validation Test Sets for Improving the Stuck-at Fault Coverage of RTL Circuits

Lingappan, L., Gangaram, V., Jha, N.K., Chakravarty, S.
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Volume:
17
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/tvlsi.2009.2013981
Date:
May, 2009
File:
PDF, 528 KB
english, 2009
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