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[IEEE 2009 IEEE Intrumentation and Measurement Technology Conference (I2MTC) - Singapore. Singapore (2009.05.5-2009.05.7)] 2009 IEEE Intrumentation and Measurement Technology Conference - Random and systematic error analysis in the complex permittivity measurements of high dielectric strength thermoplastics
Rahman, Nahid, Ayala, Ana I. Medina, Korolev, Konstantin A., Afsar, Mohammed N., Cheung, Rudy, Aghion, MauriceYear:
2009
Language:
english
DOI:
10.1109/imtc.2009.5168705
File:
PDF, 556 KB
english, 2009