[IEEE 2012 4th Electronic System-Integration Technology Conference (ESTC) - Amsterdam, Netherlands (2012.09.17-2012.09.20)] 2012 4th Electronic System-Integration Technology Conference - Investigating capacitor lifetimes under thermal stress
Rajmond, Jano, Dan, PiticaYear:
2012
Language:
english
DOI:
10.1109/estc.2012.6542199
File:
PDF, 926 KB
english, 2012