Electrical impedance tomography through constrained...

Measurement Science and Technology 2007 / 09 Vol. 18; Iss. 9

Electrical impedance tomography through constrained sequential linear programming: a topology optimization approach

Lima, Cícero R de, Mello, Luis A M, Lima, Raul Gonzalez, Silva, Emílio C N
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Volume:
18
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/18/9/014
Date:
September, 2007
File:
PDF, 1.15 MB
english, 2007
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