[IEEE 2010 20th International Conference on Pattern Recognition (ICPR) - Istanbul, Turkey (2010.08.23-2010.08.26)] 2010 20th International Conference on Pattern Recognition - Combining Force Histogram and Discrete Lines to Extract Dashed Lines
Debled-Rennesson, Isabelle, Wendling, LaurentYear:
2010
Language:
english
DOI:
10.1109/icpr.2010.389
File:
PDF, 503 KB
english, 2010