![](/img/cover-not-exists.png)
[IEEE 2011 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR) - Guilin, China (2011.07.10-2011.07.13)] 2011 International Conference on Wavelet Analysis and Pattern Recognition - Adaptive block threshold and tight frames for image denoising
Yu, Yi-Bin, Zheng, Xiao-Ben, Gan, Jun-YingYear:
2011
Language:
english
DOI:
10.1109/icwapr.2011.6014465
File:
PDF, 554 KB
english, 2011