[IEEE Technology of Integrated Systems in Nanoscale Era (DTIS) - Hammamet, Tunisia (2010.03.23-2010.03.25)] 5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - An analytical subthreshold swing model to study the scalability limits of double-gate MOSFETs including bulk traps effects
Abdi, M.A., Djeffal, F., Arar, D., Bendib, T.Year:
2010
Language:
english
DOI:
10.1109/dtis.2010.5487568
File:
PDF, 358 KB
english, 2010