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[IEEE 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Melbourne VIC, Australia (2014.6.1-2014.6.5)] 2014 IEEE International Symposium on Circuits and Systems (ISCAS) - Design and validation of a novel reconfigurable and defect tolerant JTAG scan chain
Blaquiere, Yves, Basile-Bellavance, Yan, Berrima, Safa, Savaria, YvonYear:
2014
Language:
english
DOI:
10.1109/iscas.2014.6865695
File:
PDF, 933 KB
english, 2014