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[IEEE 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Xian, China (2012.10.29-2012.11.1)] 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology - Modeling and separate extraction of bias-dependent and bias-independent S/D resistances in MOSFETs
Guo, Zebang, Ye, Zuochang, Li, Xiaojian, Wang, YanYear:
2012
Language:
english
DOI:
10.1109/icsict.2012.6466734
File:
PDF, 548 KB
english, 2012