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[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Loop flattening & spherical sampling: Highly efficient model reduction techniques for SRAM yield analysis
Qazi, Masood, Tikekar, Mehul, Dolecek, Lara, Shah, Devavrat, Chandrakasan, AnanthaYear:
2010
Language:
english
DOI:
10.1109/date.2010.5456940
File:
PDF, 600 KB
english, 2010