[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - 180nm FRAM reliability demonstration with ten years data retention at 125°C
Rodriguez, J., Rodriguez-Latorre, J., Zhou, C., Venugopal, A., Acosta, A., Ball, M., Ndai, P., Madan, S., McAdams, H., Udayakumar, K. R., Summerfelt, S., San, T., Moise, T.Year:
2013
Language:
english
DOI:
10.1109/irps.2013.6532102
File:
PDF, 456 KB
english, 2013