[IEEE 2010 27th International Conference on...

  • Main
  • [IEEE 2010 27th International...

[IEEE 2010 27th International Conference on Microelectronics Proceedings - Nis, Serbia (2010.05.16-2010.05.19)] 2010 27th International Conference on Microelectronics Proceedings - Probing the electrical properties of the Si nitride/Si interface

Tsonos, C., Kanapitsas, A., Karagounis, A., Stavrakas, I., Triantis, D., Anastasiadis, C., Photopoulos, P., Vamvakas, V. Em., Pissis, P.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2010
Language:
english
DOI:
10.1109/miel.2010.5490441
File:
PDF, 330 KB
english, 2010
Conversion to is in progress
Conversion to is failed