[IEEE 2009 Asian Test Symposium - Taichung, Taiwan (2009.11.23-2009.11.26)] 2009 Asian Test Symposium - Test Integration for SOC Supporting Very Low-Cost Testers
Chi, Chun-Chuan, Lo, Chih-Yen, Ko, Te-Wen, Wu, Cheng-WenYear:
2009
Language:
english
DOI:
10.1109/ats.2009.51
File:
PDF, 428 KB
english, 2009