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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Timing-Aware Multiple-Delay-Fault Diagnosis
Mehta, Vishal J., Marek-Sadowska, Malgorzata, Tsai, Kun-Han, Rajski, JanuszYear:
2008
Language:
english
DOI:
10.1109/isqed.2008.4479734
File:
PDF, 392 KB
english, 2008