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[IEEE 2007 American Control Conference - New York, NY, USA (2007.07.9-2007.07.13)] 2007 American Control Conference - Procedure based on mutual information and bayesian networks for the fault diagnosis of industrial systems
Verron, Sylvain, Tiplica, Teodor, Kobi, AbdessamadYear:
2007
Language:
english
DOI:
10.1109/acc.2007.4282400
File:
PDF, 475 KB
english, 2007