[IEEE 2007 Joint 50th IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) and the IEEE Northeast Workshop on Circuits and Systems (NEWCAS 2007) - Montreal, QC, Canada (2007.08.5-2007.08.8)] 2007 50th Midwest Symposium on Circuits and Systems - Integrated test scheduling, wrapper design, and TAM assignment for hierarchical SOC
Harmanani, Haidar M., Farah, RanaYear:
2007
Language:
english
DOI:
10.1109/mwscas.2007.4488807
File:
PDF, 240 KB
english, 2007