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[IEEE 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - San Francisco, CA, USA (2007.02.11-2007.02.15)] 2007 IEEE International Solid-State Circuits Conference. Digest of Technical Papers - A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB/s Read Throughput
Lee, Kwang-Jin, Cho, Beak-Hyung, Cho, Woo-Yeong, Kang, Sangbeom, Choi, Byung-Gil, Oh, Hyung-Rok, Lee, Chang-Soo, Kim, Hye-Jin, Park, Joon-Min, Wang, Qi, Park, Mu-Hui, Ro, Yu-Hwan, Choi, Joon-Yong, KimYear:
2007
Language:
english
DOI:
10.1109/isscc.2007.373499
File:
PDF, 2.72 MB
english, 2007