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[Int. Test Conference International Test Conference 1996. Test and Design Validity - Washington, DC, USA (20-25 Oct. 1996)] Proceedings International Test Conference 1996. Test and Design Validity - Manufacturing test of fibre channel communications cards and optical subassemblies
DeFoster, S., Karst, D., Peterson, M., Sendelbach, P., Kottschade, K.Year:
1996
Language:
english
DOI:
10.1109/test.1996.556954
File:
PDF, 761 KB
english, 1996