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[IEEE 2009 IEEE Custom Integrated Circuits Conference (CICC) - San Jose, CA, USA (2009.09.13-2009.09.16)] 2009 IEEE Custom Integrated Circuits Conference - An on-chip all-digital measurement circuit to characterize phase-locked loop response in 45-nm SOI
Fischette, Dennis, DeSantis, Richard, Lee, John HaeseonYear:
2009
Language:
english
DOI:
10.1109/cicc.2009.5280739
File:
PDF, 589 KB
english, 2009