The Thickness Dependence of the Electrical and Dielectric...

Integrated Ferroelectrics 2002 / 01 Vol. 50; Iss. 1

The Thickness Dependence of the Electrical and Dielectric Properties in the Laser Ablated SrBi 2 Nb 2 O 9 Thin Films

Bhattacharyya, S., Victor, P., Laha, A., Krupanidhi, S. B.
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Volume:
50
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580215514
Date:
January, 2002
File:
PDF, 416 KB
english, 2002
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