[IEEE 2014 IEEE International Ultrasonics Symposium (IUS) - Chicago, IL, USA (2014.9.3-2014.9.6)] 2014 IEEE International Ultrasonics Symposium - Manufacturing and reliability of chip-scale packaged FBAR oscillators
Gilbert, Stephen R., Small, Martha, Parker, Reed, Callaghan, Lori, Ortiz, Steve, Bi, Frank, Kekoa, Lexie, Tan, Jackie, Alias, Norashaz Bin, Ong, Gerald, Chen, Choon Chowe, Ruby, RichYear:
2014
Language:
english
DOI:
10.1109/ultsym.2014.0023
File:
PDF, 1.31 MB
english, 2014