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[IEEE Third ACM & amp; IEEE International Conference on Formal Methods and Models for Co-Design - Verona, Italy (11-14 July 2005)] Proceedings. Second ACM and IEEE International Conference on Formal Methods and Models for Co-Design, 2005. MEMOCODE '05. - On the use of a high-level fault model to analyze logical consequence of properties
Brait, S., Fummi, F., Pravadelli, G.Year:
2005
Language:
english
DOI:
10.1109/memcod.2005.1487918
File:
PDF, 352 KB
english, 2005