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Gram yield estimation through SVI under variable soil and management conditions
Verma, K. S., Saxena, R. K., Hajare, T. N., Kumar, S. C. RameshVolume:
19
Language:
english
Journal:
International Journal of Remote Sensing
DOI:
10.1080/014311698214569
Date:
January, 1998
File:
PDF, 190 KB
english, 1998