[IEEE International Technical Digest on Electron Devices Meeting - Washington, DC, USA (3-6 Dec. 1989)] International Technical Digest on Electron Devices Meeting - A high performance CMOS process for submicron 16 Mb EPROM
Bergemont, A., Deleonibus, S., Guegan, G., Guillaumot, B., Laurens, M., Martin, F.Year:
1989
Language:
english
DOI:
10.1109/iedm.1989.74350
File:
PDF, 331 KB
english, 1989