Photoelectron diffraction study and structure determination...

Journal of Electron Spectroscopy and Related Phenomena 2007 Vol. 156-158; Iss. none

Photoelectron diffraction study and structure determination of ultrathin hafnium silicide layers on silicon(1 0 0) using Mg Kα radiation and synchrotron light

C.R. Flüchter, A. de Siervo, D. Weier, M. Schürmann, U. Berges, S. Dreiner, M.F. Carazzolle, R. Landers, G.G. Kleiman, C. Westphal
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Volume:
156-158
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.elspec.2006.11.028
File:
PDF, 708 KB
english, 2007
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