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Characterization of oxide layers formed on electrochemically treated Ti by using soft X-ray absorption measurements
R.G. Wilks, E. Santos Jr, E.Z. Kurmaev, M.V. Yablonskikh, A. Moewes, N.K. Kuromoto, G.A. SoaresVolume:
169
Year:
2009
Language:
english
Pages:
5
DOI:
10.1016/j.elspec.2008.11.001
File:
PDF, 1.26 MB
english, 2009