The origin and elimination of random single-bit failure in...

Integrated Ferroelectrics 2001 / 01 Vol. 39; Iss. 1-4

The origin and elimination of random single-bit failure in high density 1t1c fram

Kim, H. H., Jung, D. J., Lee, S. Y., Song, Y. J., Jang, N. W., Lee, J. K., Kim, Kinam
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Volume:
39
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580108011947
Date:
January, 2001
File:
PDF, 914 KB
english, 2001
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