[IEEE 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - Orlando, FL, USA (2014.5.27-2014.5.30)] 2014 IEEE 64th Electronic Components and Technology Conference (ECTC) - High resolution and fast throughput-time X-ray computed tomography for semiconductor packaging applications
Li, Yan, Pacheco, Mario, Goyal, Deepak, Elmer, John W., Barth, Holly D., Parkinson, DulaYear:
2014
Language:
english
DOI:
10.1109/ectc.2014.6897485
File:
PDF, 2.79 MB
english, 2014