[IEEE 2010 American Control Conference (ACC 2010) - Baltimore, MD (2010.6.30-2010.7.2)] Proceedings of the 2010 American Control Conference - Correlation analysis of alarm data and alarm limit design for industrial processes
Fan Yang,, Shah, S L, Deyun Xiao,Year:
2010
Language:
english
DOI:
10.1109/acc.2010.5530508
File:
PDF, 794 KB
english, 2010