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XPS characterisation of in situ treated lanthanum oxide and hydroxide using tailored charge referencing and peak fitting procedures
M.F. Sunding, K. Hadidi, S. Diplas, O.M. Løvvik, T.E. Norby, A.E. GunnæsVolume:
184
Year:
2011
Language:
english
Pages:
11
DOI:
10.1016/j.elspec.2011.04.002
File:
PDF, 1.50 MB
english, 2011