[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Two-point capacitance-voltage (TPCV) concept: A new method for NBTI characterization
Benabdelmoumene, Abdelmadjid, Djezzar, Boualem, Tahi, Hakim, Chenouf, Amel, Trombetta, Leonard, Kechouane, MohamedYear:
2012
Language:
english
DOI:
10.1109/iirw.2012.6468949
File:
PDF, 420 KB
english, 2012