[IEEE 2012 35th IEEE/CPMT International Electronics...

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[IEEE 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Ipoh, Perak, Malaysia (2012.11.6-2012.11.8)] 2012 35th IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT) - Characterization of a wire bonding process with the added challenges from palladium-coated copper wires

Chang, A C K, Lim, A B Y, Lee, C X, Milton, B, Clauberg, H, Yauw, O, Chylak, B
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Year:
2012
Language:
english
DOI:
10.1109/iemt.2012.6521834
File:
PDF, 1.08 MB
english, 2012
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