Irradiation effects in ultrathin Si/SiO/sub 2/ structures
Cantin, J.L., von Bardeleben, H.J., Autran, J.L.Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.685215
Date:
June, 1998
File:
PDF, 560 KB
english, 1998