[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Detecting and diagnosing open defects
Tran, Dat, Winemberg, LeRoy, Carder, Darrell, Lin, Xijiang, LeBritton, Joe, Swanson, BruceYear:
2010
Language:
english
DOI:
10.1109/test.2010.5699303
File:
PDF, 66 KB
english, 2010