[IEEE 8th International Symposium on Quality Electronic Design (ISQED'07) - San Jose, CA, USA (2007.03.26-2007.03.28)] 8th International Symposium on Quality Electronic Design (ISQED'07) - Function-Based Test Generation for (Non-Robust) Path Delay Faults Using the Launch-off-Capture Scan Architecture
Adapa, Rajsekhar, Flanigan, Edward, Tragoudas, Spyros, Laisne, Michael, Cui, Hailong, Petrov, TsvetomirYear:
2007
Language:
english
DOI:
10.1109/isqed.2007.81
File:
PDF, 134 KB
english, 2007