Atomic Force Microscopy Simulation by MD/Continuum Coupling Method
Senda, Yasuhiro, Imahashi, Nobuyuki, Shimamura, Shuji, Blomqvist, Janne, Nieminen, RistoVolume:
155
Language:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584587.2014.905108
Date:
July, 2014
File:
PDF, 216 KB
english, 2014