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[IEEE IEEE Custom Integrated Circuits Conference 2006 - San Jose, CA, USA (2006.09.10-2006.09.13)] IEEE Custom Integrated Circuits Conference 2006 - Measurement results of delay degradation due to power supply noise well correlated with full-chip simulation
Ogasahara, Yasuhiro, Enami, Takashi, Hashimoto, Masanori, Sato, Takashi, Onoye, TakaoYear:
2006
Language:
english
DOI:
10.1109/cicc.2006.320930
File:
PDF, 845 KB
english, 2006