[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Impact of hump effect on MOSFET mismatch in the sub-threshold area for low power analog applications
Joly, Yohan, Lopez, Laurent, Portal, Jean-Michel, Aziza, Hassen, Bert, Yannick, Julien, Franck, Fornara, PascalYear:
2010
Language:
english
DOI:
10.1109/icsict.2010.5667684
File:
PDF, 502 KB
english, 2010