[IEEE 2008 2nd Electronics Systemintegration Technology Conference - Greenwich (2008.09.1-2008.09.4)] 2008 2nd Electronics Systemintegration Technology Conference - RF multi-DUT testing technology for RF WLP
Hyunho Kim,, Yongdeuk Ye,, Sanghyun Choi,, Jun Lim,, Soongyu Yim,, Sung Yi,Year:
2008
Language:
english
DOI:
10.1109/estc.2008.4684408
File:
PDF, 8.91 MB
english, 2008