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[IEEE 1993 IEEE International Symposium on Circuits and Systems - Chicago, IL, USA (3-6 May 1993)] 1993 IEEE International Symposium on Circuits and Systems - Functional testing and constrained synthesis of sequential architectures
Buonanno, G., Fummi, F., Sciuto, D.Year:
1993
Language:
english
DOI:
10.1109/iscas.1993.394025
File:
PDF, 449 KB
english, 1993