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[IEEE 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - Tsinghua University (2007.06.3-2007.06.4)] 2007 International Workshop on Electron Devices and Semiconductor Technology (EDST) - Threshold-Voltage Modeling of Bulk FinFETs by Considering Charge-Sharing and Surface Potential
Lee, Jong-Ho, Choi, Byung-KilYear:
2007
Language:
english
DOI:
10.1109/edst.2007.4289770
File:
PDF, 3.63 MB
english, 2007