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[IEEE 2010 IEEE Fourth International Conference On Biometrics: Theory, Applications And Systems (BTAS) - Washington, DC, USA (2010.09.27-2010.09.29)] 2010 Fourth IEEE International Conference on Biometrics: Theory, Applications and Systems (BTAS) - A novel similarity measurement for minutiae-based fingerprint verification
Liu, Yukun, Li, Dongju, Isshiki, Tsuyoshi, Kunieda, HiroakiYear:
2010
Language:
english
DOI:
10.1109/btas.2010.5634521
File:
PDF, 190 KB
english, 2010