Simulation of External Ion Injection, Cooling and Extraction Processes with SIMION 6.0 for the Ion Trap/Reflectron Time-of-flight Mass Spectrometer
Ling He, David M. LubmanVolume:
11
Year:
1997
Language:
english
Pages:
11
DOI:
10.1002/(sici)1097-0231(19970830)11:133.0.co;2-x
File:
PDF, 370 KB
english, 1997