Secondary ion mass spectroscopy (SIMS) in the analysis of...

Secondary ion mass spectroscopy (SIMS) in the analysis of elemental micropatterns in tree rings

Martin, R.R., Sylvester, T., Biesinger, M.C.
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Volume:
24
Journal:
Canadian Journal of Forest Research
DOI:
10.1139/x94-298
Date:
November, 1994
File:
PDF, 36 KB
1994
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